7980 2D/3D晶圆量测系统
Chroma 7980 2D/3D晶圆量测系统采用新开发的BLiS技术和专门设计的高精密平台,提供准确可靠的2D/3D次奈米级量测及轮廓资讯。目前针对半导体制程不同的应用如关键尺寸量测(CD)、深度或高度、覆盖偏差(Overlay)、粗糙度(Roughness)等,提供专门软件:系统拥有大面积拼接能力、快速定位及对焦、量测品质监控,并提供量测结果的2D/3D图形显示,让用户快速的进行分析使用。
产品性能特点
专利开发BLiS技术,提供非破坏性的光学尺寸量测
提供快速定位与对焦以达更高效率量测(WPH)
针对大面积被测物提供巨量接图功能
系统自我品质监控,确保量测数值之准确与可靠
适用于6”~12"晶圆,提供半自动与全自动机型
通过SEMI S.2认证
半导体应用
先进封装:TSV,VIA,RDL
2D/3D关键尺寸(CD)量测:Overlay,Film Thickness,.Bump Height,Step Height
奈米级3D表面轮廓及粗糙度
技术参数
Model | 7980 |
Applications | |
Wafer Size | Up to 12" |
Processes Monitor | TSV: TCD, BCD, Depth; RDL: TCD、BCD、Depth Bump Height、Step Height UBMOverlay Film Thickness Surface Profile |
Configurations | |
Automation | Semi-Automatic / Fully Automatic |
Objective Selection | 3D Lens: 5X, 10X, 20X, 50X (Others available) |
Illuminator | LED |
Focus | Motorized manual/automated |
Z-Drive(Focus) Stage | 60 mm |
Motorized Stage | Travel range: X: 475 mm, Y: 410 mm |
Isolation | Active Isolation system |
Chuck | 12" wafer fixture with vacuum |
System Controller | i7 class PC with running under Microsoft Windows 10 (64-bit) |
Software | Application Software and UI SECS/GEM |
Facility | |
Clean Room | ISO Class 5 |
Power | AC 220V±10% |
* Specifications are subject to change without notice. |