台湾chroma 八站逻辑测试分类机 3180

Dimension (WxDxH)

1860 mm x 1380 mm x 2050 mm

Weight

Approx. 1300 kg

Facility

Power : AC220, 50/60 Hz Single-Phase,   10 KVA Max.

Compressed Air : 0.5 MPa or higher   (dry and clean air) Flow Rate : 120 L/min., constant supply

Applicable Device

Type : BGA, QFP, CSP, QFN, Flip chip,   TSOP, etc.

Package Size : 3 mm x 3 mm to 50   mm x 50 mm *

Contact Mode

Direct contact / Drop and Press

Interface

Standard : TTL, GPIB

Option : RS232, TCPIP

Multiple Site

Octal Sites (4x2)

Matrix Quad Sites (2x2) In-line Quad   Sites (4x1)

Contact Area

Test Head Area : 583 mm (from socket   center)

Docking Height : 1100 mm (1000/1200mm   option)

Index Time

0.4 sec (excluding tester communication   time)

Jam Rate

1/10,000

Category

6 categories (3 auto, 3 manual)

Contact Force

Up to 120 kgf

Mounting Type

Direct mount / Side Mount

Applicable Tray

JEDEC

Throughout (Max.)

Up to 9000 UPH (Illustrated by BGA   4x6, 20x37 tray matrix)

High Temperature (Option)

Operating Range : ~ 150℃ (Heating time < 30 min.)

Accuracy : Contact Head ± 3 ℃, Pre-heater ± 5 ℃