台湾chroma 光电组件晶圆点测系统 58635 Series

Measruements

LIV and λ

Near Field

Far Field

LIV and Near Field

two-in-One

Measurement Capability

LIV sweep, Leakage current, Ith,

Kink, Center wavelength (λc),

Peak wavelength (λp),FWHM

Beam Diameter, Beam divergence angle,Beam propagation ratio, Emitter power   uniformity,Dead emitter count

 Beam divergence, Max  

energy/power through 7mm aperture

 All LIV &

Near Field test items

Optical Test Module

Integrating sphere with spectrometer

CCD Camera with auto focus microscope system

CCD Camera

Special Two-in-One design

Temperature Control

Capability

25~85˚C (standard)

0~100˚C (option)

SMU Specifications

Channel Counts

Depend on DUT structure, configurable   by PXI base

SMU Features

PXI base, Bi-polar, 25W/channel,   4 wires, CW and QCW

Voltage Ranges

±25V, ±12.5V, ±10V, ±5V, ±2V, ±1V,   ±500mV, ±200mV, ±100mV

Current Ranges

±6A(only pulse mode), ±3.5A(≦5V), ±2.5A(≦10V), ±1A,

±100mA, ±10mA, ±1mA, ±100uA, ±10uA,   ±1uA

Current Pulse Width

>100µs

Pulse Duty Cycle

<10% ( when 2.5A< current <   3.5A, pulse width ≦5ms, voltage<5V)

<5% (when 3.5A< current <6A,   pulse width ≦5ms, voltage<5V)